SPECTROSCOPIC STUDIES OF THE INFLUENCE OF OXYGEN PARTIAL-PRESSURE ON THE INCORPORATION OF RESIDUAL SILICON IMPURITIES IN VAPOR-PHASE EPITAXIAL GALLIUM-ARSENIDE

被引:6
作者
LEE, B [1 ]
ARAI, K [1 ]
SKROMME, BJ [1 ]
BOSE, SS [1 ]
ROTH, TJ [1 ]
AGUILAR, JA [1 ]
LEPKOWSKI, TR [1 ]
TIEN, NC [1 ]
STILLMAN, GE [1 ]
机构
[1] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
关键词
D O I
10.1063/1.344040
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3772 / 3786
页数:15
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