USING A 10-KEV X-RAY SOURCE FOR HARDNESS ASSURANCE

被引：35

作者：

FLEETWOOD, DM

BEEGLE, RW

SEXTON, FW

WINOKUR, PS

MILLER, SL

TREECE, RK

SCHWANK, JR

JONES, RV

MCWHORTER, PJ

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期

关键词：

D O I：

10.1109/TNS.1986.4334601

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1330 / 1336

页数：7

共 32 条

[1]

BEEGLE RW, UNPUB

[2]

BEEZHOLD W, 1986, HEART C

[3] THE RELATIONSHIP BETWEEN CO-60 AND 10-KEV X-RAY-DAMAGE IN MOS DEVICES [J].

BENEDETTO, JM ;

BOESCH, HE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1318-1323

[4] PHOTOELECTRON EFFECTS ON THE DOSE DEPOSITED IN MOS DEVICES BY LOW-ENERGY X-RAY SOURCES [J].

BROWN, DB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1465-1468

[5] THE PHENOMENON OF ELECTRON ROLLOUT FOR ENERGY DEPOSITION AND DEFECT GENERATION IN IRRADIATED MOS DEVICES [J].

BROWN, DB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1240-1244

[6] ELECTRON-HOLE RECOMBINATION IN IRRADIATED SIO2 FROM A MICRODOSIMETRY VIEWPOINT [J].

BROWN, DB ;

DOZIER, CM .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4142-4144

[7] DEFECT PRODUCTION IN SIO2 BY X-RAY AND CO-60 RADIATIONS [J].

DOZIER, CM ;

BROWN, DB ;

THROCKMORTON, JL ;

MA, DI .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4363-4368

[8] THE USE OF LOW-ENERGY X-RAYS FOR DEVICE TESTING - A COMPARISON WITH CO-60 RADIATION [J].

DOZIER, CM ;

BROWN, DB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4382-4387

[9] EFFECT OF PHOTON ENERGY ON THE RESPONSE OF MOS DEVICES [J].

DOZIER, CM ;

BROWN, DB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4137-4141

[10] USE OF THE SUBTHRESHOLD BEHAVIOR TO COMPARE X-RAY AND CO-60 RADIATION-INDUCED DEFECTS IN MOS-TRANSISTORS [J].

DOZIER, CM ;

BROWN, DB ;

FREITAG, RK ;

THROCKMORTON, JL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1324-1329

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