REFLECTION ELECTRON-MICROSCOPE STUDY OF PT(111) SURFACES

[11] STEP MOTION ON CRYSTAL SURFACES .2. [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) : 614 - +

[12] REFLECTION ELECTRON-MICROSCOPE STUDY OF THE INITIAL-STAGES OF OXIDATION OF SI(111)-7 X 7 SURFACES [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 453 - 461

[13] TECHNIQUES FOR ROUTINE UHV INSITU ELECTRON-MICROSCOPY OF GROWTH PROCESSES OF EPITAXIAL THIN-FILMS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (05): : 441 - 448

[14] TANISHIRO Y, 1986, J MICROSC-OXFORD, V142, P211, DOI 10.1111/j.1365-2818.1986.tb02758.x

[15] ON THE PHASE-TRANSITION BETWEEN THE (7X7) AND (1X1) STRUCTURES OF SILICON(111) SURFACE STUDIED BY REFLECTION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 95 - 102

[16] TANISHIRO Y, 1981, ACTA CRYSTALLOGR A, V37, pC300

[17] TANISHIRO Y, 1982, 10TH P INT C EL MICR, V2, P299

[18] YAGI K, 1980, P 4 ICSS, V2, P1007

[19] YAGI K, 1982, SCANNING ELECTRON MI, V4, P1421

[20] SURFACE IMAGING OF III-V SEMICONDUCTORS BY REFLECTION ELECTRON-MICROSCOPY AND INNER POTENTIAL MEASUREMENTS [J]. THIN SOLID FILMS, 1983, 104 (1-2) : 43 - 55

[11] STEP MOTION ON CRYSTAL SURFACES .2. [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) : 614 - +

[12] REFLECTION ELECTRON-MICROSCOPE STUDY OF THE INITIAL-STAGES OF OXIDATION OF SI(111)-7 X 7 SURFACES [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 453 - 461

[13] TECHNIQUES FOR ROUTINE UHV INSITU ELECTRON-MICROSCOPY OF GROWTH PROCESSES OF EPITAXIAL THIN-FILMS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (05): : 441 - 448

[14] TANISHIRO Y, 1986, J MICROSC-OXFORD, V142, P211, DOI 10.1111/j.1365-2818.1986.tb02758.x

[15] ON THE PHASE-TRANSITION BETWEEN THE (7X7) AND (1X1) STRUCTURES OF SILICON(111) SURFACE STUDIED BY REFLECTION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 95 - 102

[16] TANISHIRO Y, 1981, ACTA CRYSTALLOGR A, V37, pC300

[17] TANISHIRO Y, 1982, 10TH P INT C EL MICR, V2, P299

[18] YAGI K, 1980, P 4 ICSS, V2, P1007

[19] YAGI K, 1982, SCANNING ELECTRON MI, V4, P1421

[20] SURFACE IMAGING OF III-V SEMICONDUCTORS BY REFLECTION ELECTRON-MICROSCOPY AND INNER POTENTIAL MEASUREMENTS [J]. THIN SOLID FILMS, 1983, 104 (1-2) : 43 - 55