ASYMPTOTIC BRAGG-DIFFRACTION - SINGLE-CRYSTAL SURFACE-ADJOINING-LAYER STRUCTURE-ANALYSIS

[1] Afanas'ev A. M., 1981, Soviet Physics - Crystallography, V26, P13

[2] DIFFRACTION SCATTERING AT ANGLES FAR FROM THE BRAGG ANGLE AND THE STRUCTURE OF THIN SUBSURFACE LAYERS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 (JUL): : 352 - 355

[3] Aleksandrov P. A., 1981, Soviet Physics - Crystallography, V26, P725

[4] X-RAY BRILLOUIN-SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (23) : 1519 - +

[5] APPLICATIONS OF X-RAY TRIPLE CRYSTAL DIFFRACTOMETRY TO STUDIES ON THE DIFFUSION-INDUCED DEFECTS IN SILICON-CRYSTALS [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 54 (02): : 701 - 706

[6] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02): : 533 - 542

[7] van Hove M.A., 1979, SURFACE CRYSTALLOGRA

[8] YAKIMOV SS, 1984, PISMA ZHETF, V39, P3

[1] Afanas'ev A. M., 1981, Soviet Physics - Crystallography, V26, P13

[2] DIFFRACTION SCATTERING AT ANGLES FAR FROM THE BRAGG ANGLE AND THE STRUCTURE OF THIN SUBSURFACE LAYERS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 (JUL): : 352 - 355

[3] Aleksandrov P. A., 1981, Soviet Physics - Crystallography, V26, P725

[4] X-RAY BRILLOUIN-SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (23) : 1519 - +

[5] APPLICATIONS OF X-RAY TRIPLE CRYSTAL DIFFRACTOMETRY TO STUDIES ON THE DIFFUSION-INDUCED DEFECTS IN SILICON-CRYSTALS [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 54 (02): : 701 - 706

[6] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02): : 533 - 542

[7] van Hove M.A., 1979, SURFACE CRYSTALLOGRA

[8] YAKIMOV SS, 1984, PISMA ZHETF, V39, P3