OPTICAL MODULATION SPECTROSCOPY OF DANGLING BONDS IN A-SI-H

被引:18
作者
GREVENDONK, W [1 ]
VERLUYTEN, M [1 ]
DAUWEN, J [1 ]
ADRIAENSSENS, GJ [1 ]
BEZEMER, J [1 ]
机构
[1] STATE UNIV UTRECHT,DEPT ATOM & INTERFACE PHYS,3508 TA UTRECHT,NETHERLANDS
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 61卷 / 03期
关键词
D O I
10.1080/13642819008208642
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Optical modulation spectroscopy in a-Si:H at room temperature has been studied for six samples, deposited at different substrate temperatures Ts and hence containing different amounts of hydrogen. The experimental results can be described with one photoinduced absorption and one photoinduced bleaching term. The transition energies are independent of Ts so that it may be concluded that mainly dangling bonds and the conduction band are involved. The negatively charged dangling bond D-is situated 0.85 eV below the conduction-band edge. The neutral D° lies 1.25 eV below that edge. It can be argued that these values are not necessarily in conflict with the experimental value (0.75 eV) for the dark-current activation energy. © 1990 Taylor & Francis Ltd.
引用
收藏
页码:393 / 402
页数:10
相关论文
共 29 条
[1]   GAP STATES IN UNDOPED AMORPHOUS-SILICON STUDIED BY BELOW-GAP MODULATED PHOTOCURRENT SPECTROSCOPY [J].
ABE, K ;
OKAMOTO, H ;
NITTA, Y ;
TSUTSUMI, Y ;
HATTORI, K ;
HAMAKAWA, Y .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1988, 58 (02) :171-184
[2]   IDENTIFICATION OF THE DANGLING-BOND STATE WITHIN THE MOBILITY GAP OF ALPHA-SI-H BY DEPLETION-WIDTH-MODULATED ELECTRON-SPIN-RESONANCE SPECTROSCOPY [J].
COHEN, JD ;
HARBISON, JP ;
WECHT, KW .
PHYSICAL REVIEW LETTERS, 1982, 48 (02) :109-112
[3]   SPACE-CHARGE SPECTROSCOPY OF THE GAP STATES IN HYDROGENATED AMORPHOUS-SILICON COUNTERDOPED WITH BORON [J].
CULLEN, P ;
HARBISON, JP ;
LANG, DV ;
ADLER, D .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1983, 59-6 (DEC) :261-264
[4]   OPTICAL MODULATION SPECTROSCOPY IN A-SI-H AT ROOM-TEMPERATURE [J].
GREVENDONK, W ;
DAUWEN, J ;
ADRIAENSSENS, GJ ;
SEYNHAEVE, G ;
STRAUVEN, H ;
NAGELS, P ;
SMEETS, J .
SOLID STATE COMMUNICATIONS, 1988, 66 (08) :801-803
[5]   EVIDENCE FOR METASTABLE DEFECTS IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J].
HEPBURN, AR ;
MARSHALL, JM ;
MAIN, C ;
POWELL, MJ ;
VANBERKEL, C .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 :1409-1412
[6]   LEVEL OF DANGLING-BOND CENTERS IN A-SI-H [J].
HIRABAYASHI, I ;
MORIGAKI, K .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1986, 54 (05) :L119-L123
[7]  
JACKSON WB, 1982, PHYS REV B, V25, P559
[8]   DEEP-LEVEL DISTRIBUTIONS IN HYDROGENATED AMORPHOUS-SILICON [J].
JOHNSON, NM .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1983, 59-6 (DEC) :265-268
[9]   IDENTIFICATION OF DEEP-GAP STATES IN ALPHA-SI-H BY PHOTODEPOPULATION-INDUCED ELECTRON-SPIN RESONANCE [J].
JOHNSON, NM ;
BIEGELSEN, DK .
PHYSICAL REVIEW B, 1985, 31 (06) :4066-4069