MAGNETIC MICROFIELD ANALYSIS BY FORCE MICROSCOPY

被引：6

作者：

HARTMANN, U

机构：

[1] Institut für Schicht- und Ionentechnik, KFA-Jülich

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1990年 / 83卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(90)90619-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The potential of magnetic force microscopy (MFM) for a nondestructive, highresolution, and quantitative imaging of magnetic microstructures is discussed. Experimental examples are provided by MFM data of Bloch walls and digital bit structures on a commercial magnetic recording medium. © 1990.

引用

收藏

页码：545 / 547

页数：3

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