AN SNO(2) BASED SWITCHING TUNNEL DEVICE FOR THE DETECTION OF NO(2) IN AIR AT THE SUB PPM LEVEL

被引:10
作者
BARBI, GB
BLANCO, JS
BAROFFIO, M
AGAPITO, J
GUTIERREZ, FJ
机构
[1] UNIV COMPLUTENSE,FAC FIS,DEPT ELECTRON,E-28040 MADRID,SPAIN
[2] CSIC,CENFA TORRES QUEVEDO,SENSORES LAB,E-28015 MADRID,SPAIN
关键词
D O I
10.1016/0925-4005(94)87064-0
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A new device has been developed for the detection of low NO2 concentrations in air. The structure consists of a p+-Si substrate, an n-Si epitaxial layer, a thin tunnel SiO2 layer and a thin SnO2 sputtered film. Some of the sensors have been catalyzed with a thin Al sputtered layer to improve the sensitivity and response rate to NO2. The electrical I-V characteristics are those of a tunnel diode, which shows a bi-stable (low impedance, high impedance) behaviour. The switch may be accounted for by punchthrough and avalanche multiplication at the n-Si layer. It was found that the switching voltage is an increasing function of the NO2 concentration, as the work function of the SnO2 increases with the ionosorption of the electronegative NO2 molecules. The possibility of detecting NO2 concentrations as low as 50 ppb in air has been demonstrated.
引用
收藏
页码:93 / 98
页数:6
相关论文
共 10 条
[1]  
BARBI GB, 1993, SENSOR ACTUAT B-CHEM, V15, P372
[2]   THIN-FILM SEMICONDUCTOR NOX SENSOR [J].
CHANG, SC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (12) :1875-1880
[3]   TUNNELING IN METAL-OXIDE-SILICON STRUCTURES [J].
DAHLKE, WE ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1967, 10 (08) :865-&
[4]   THEORY OF SWITCHING IN P-N-INSULATOR (TUNNEL)-METAL DEVICES .1. PUNCHTHROUGH MODE [J].
HABIB, SED ;
SIMMONS, JG .
SOLID-STATE ELECTRONICS, 1979, 22 (02) :181-192
[5]   SEMICONDUCTOR GAS SENSORS [J].
MORRISON, SR .
SENSORS AND ACTUATORS, 1982, 2 (04) :329-341
[6]  
NEAMEN DA, 1992, SEMICONDUCTOR PHYSIC, P482
[7]   THEORY OF SWITCHING PHENOMENA IN METAL-SEMI-INSULATOR-N-P+ SILICON DEVICES [J].
SIMMONS, JG ;
ELBADRY, A .
SOLID-STATE ELECTRONICS, 1977, 20 (12) :955-961
[8]  
SZE SM, 1981, PHYSICS SEMICONDUCTO, P99
[9]  
WEAST RC, 1974, HDB CHEM PHYSICS
[10]   THIN-MIS-STRUCTURE SI NEGATIVE-RESISTANCE DIODE [J].
YAMAMOTO, T ;
MORIMOTO, M .
APPLIED PHYSICS LETTERS, 1972, 20 (08) :269-&