EFFECTS OF DIFFUSION-INDUCED DISLOCATIONS ON EXCESS LOW-FREQUENCY NOISE

被引：28

作者：

NISHIDA, M ^{[1
]}

机构：

[1] TOKYO SANYO ELECT CO LTD,SEMICOND DIV,INTEGRATED CIRCUITS DEPT,GUMMA,JAPAN

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1973年 / ED20卷 / 03期

关键词：

D O I：

10.1109/T-ED.1973.17632

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：221 / 226

页数：6

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