ELECTROMIGRATION IN THE PRESENCE OF A TEMPERATURE-GRADIENT - EXPERIMENTAL-STUDY AND MODELING

被引：11

作者：

SCHWARZENBERGER, AP

ROSS, CA

EVETTS, JE

GREER, AL

机构：

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1988年 / 17卷 / 05期

关键词：

D O I：

10.1007/BF02652135

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：473 / 478

页数：6

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