AN AES AND ELS STUDY OF INP (100) SURFACE SUBJECTED TO ARGON ION-BOMBARDMENT

被引：56

作者：

JARDIN, C ^{[1
]}

ROBERT, D ^{[1
]}

ACHARD, B ^{[1
]}

GRUZZA, B ^{[1
]}

PARISET, C ^{[1
]}

机构：

[1] UNIV CLERMONT FERRAND 2,PHYS MILIEUX CONDENSES LAB,CNRS,UA 796,F-63170 AUBIERE,FRANCE

来源：

SURFACE AND INTERFACE ANALYSIS | 1987年 / 10卷 / 06期

关键词：

D O I：

10.1002/sia.740100606

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：301 / 305

页数：5

共 18 条

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[J]. JOURNAL OF CRYSTAL GROWTH, 1985, 71 (01) : 125 - 135
[7] A STUDY BY ELASTICALLY REFLECTED ELECTRONS OF INP (100) SUBSTRATES PREVIOUSLY ION BOMBARDED
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[8] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS
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[9] JARDIN C, 1986, VIDE, V41, P219
[10] AN IMPORTANT STEP IN QUANTITATIVE AUGER ANALYSIS - THE USE OF PEAK TO BACKGROUND RATIO
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[J]. SURFACE SCIENCE, 1984, 138 (2-3) : 610 - 628

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