ORIGIN OF NONUNIFORM PROPERTIES OF YBA2CU3O7-X/CARUO3/YBA2CU3O7-X JOSEPHSON EDGE JUNCTIONS

被引：36

作者：

OLSSON, E ^{[1
]}

CHAR, K ^{[1
]}

机构：

[1] CONDUCTUS INC,SUNNYVALE,CA 94086

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 10期

关键词：

D O I：

10.1063/1.110868

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The fine scale microstructure of YBa2Cu3O7-x (YBCO)/CaRuO3 (CRO)/YBCO edge junctions has been characterized using transmission electron microscopy. The results showed that the damages due to ion beam milling during fabrication of the YBCO edges annealed out during heating to higher temperatures for deposition of additional layers. No contamination due to the ex situ processing of the edges was detected. The CRO grew epitaxially on the YBCO edge and small insulating Y2O3 particles nucleated on the CRO giving rise to inhomogeneous electrical properties along the junction. The nucleation of Y2O3 particles was enhanced by the microscopically rough morphology of the YBCO edge. The results stress the importance of the morphology of the YBCO edge and show that general conclusions about the interface structure cannot be drawn from corresponding planar geometries.

引用

页码：1292 / 1294

页数：3

共 13 条

[1] STUDY OF INTERFACE RESISTANCES IN EPITAXIAL YBA2CU3O7-X/BARRIER/YBA2CU3O7-X JUNCTIONS [J].