ORIGIN OF SHARP NEAR-INFRARED TRANSITIONS IN CHROMIUM DOPED III-V SEMICONDUCTORS

被引:41
作者
WHITE, AM [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1016/0038-1098(79)90122-4
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
It is contended that the sharp emission and absorption lines seen in GaAs:Cr and GaP:Cr at 0.839 eV and 1.029 eV are due to a type of excitonic recombination at isoelectronic sites involving chromium. This assignment contrasts strongly with the widely accepted model involving an internal d-d transition at isolated Cr2+ centres. The new description satisfactorily accounts for many puzzling features relating to the high transition energies, phonon coupling, Stokes shifts, stress splittings, non-correlation of optical and EPR data and the large multiplicity of fine structure seen in high resolution optical spectroscopy. © 1979.
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页码:205 / 208
页数:4
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