SIMPLE ANALYSIS OF STABLE FIELD PROFILE IN SUPERCRITICAL TEA

被引：16

作者：

JEPPESEN, P

JEPPSSON, BI

机构：

[1] TECH UNIV DENMARK,LAB ELECTROMAGNETIC THEORY,LYNGBY,DENMARK

[2] ROY INST TECHNOL,MICROWAVE DEPT,STOCKHOLM,SWEDEN

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1973年 / ED20卷 / 04期

关键词：

D O I：

10.1109/T-ED.1973.17658

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：371 / 379

页数：9

共 17 条

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TESZNER, JL .

ELECTRONICS LETTERS, 1971, 7 (16) :468-&

[2]

COPELAND JA, 1971, SEMICONDUCTORS SEM A, V7, P3

[3]

DOHLER G, 1971, IEEE DEVICE, VED18, P1190

[4] CURRENT INSTABILITIES IN N-INP [J].

GRUBIN, HL ;

SHAW, MP ;

CONWELL, EM .

APPLIED PHYSICS LETTERS, 1971, 18 (06) :211-&

[5] CONVECTIVE AND ABSOLUTE INSTABILITIES IN SEMICONDUCTORS EXHIBITING NEGATIVE DIFFERENTIAL MOBILITY [J].

GUERET, P .

PHYSICAL REVIEW LETTERS, 1971, 27 (05) :256-+

[6] SWITCHING BEHAVIOR OF OVER-CRITICALLY DOPED GUNN DIODES [J].

GUERET, P ;

REISER, M .

APPLIED PHYSICS LETTERS, 1972, 20 (02) :60-&

[7]

HAUGE PS, 1971, IEEE T ELECTRON DEVI, VED18, P390

[8] INFLUENCE OF DIFFUSION ON STABILITY OF SUPERCRITICAL TRANSFERRED ELECTRON AMPLIFIER [J].

JEPPESEN, P ;

JEPPSSON, B .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1972, 60 (04) :452-+

[9]

MAGARSHACK J, 1970, ISSC C DIG TECH PAPE, P132

[10]

MAGARSHACK J, 1970, P INT C MICROWAVE OP, P16

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