X-Y PLOTTER CAPACITANCE METER INTERFACE FOR DEEP LEVEL SPECTROSCOPY

被引:8
作者
BALLAND, B [1 ]
MARCHAND, JJ [1 ]
BRIOT, R [1 ]
GRANGE, G [1 ]
机构
[1] INST NATL SCI APPL LYON,GENIE ELECT & FERROELECT LAB,F-69621 VILLEURBANNE,FRANCE
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 03期
关键词
D O I
10.1088/0022-3735/14/3/023
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:367 / 372
页数:6
相关论文
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