DEEP-LEVEL CONTROLLED LIFETIME AND LUMINESCENCE EFFICIENCY IN GAP

[1] MEASUREMENT OF EXTRINSIC ROOM-TEMPERATURE MINORITY CARRIER LIFETIME IN GAP [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) : 500 - &

[2] DAKUS PD, 1973, APPL PHYS LETT, V22, P227

[3] KINETICS OF RECOMBINATION IN NITROGEN-DOPED GAP [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 4920 - 4930

[4] SAH CT, 1972, SOLID STATE ELECTRON, V13, P6

[5] SMITH BL, 1969, THESIS U MANCHESTER

[6] GREEN ELECTROLUMINESCENCE IN GAP DIODES AND ITS CORRELATION WITH CATHODOLUMINESCENCE MEASUREMENTS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (13) : 1622 - 1639

[7] DETERMINATION OF DEEP CENTERS IN CONDUCTING GALLIUM ARSENIDE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) : 3411 - &

[8] CONCENTRATION-DEPENDENCE OF MINORITY-CARRIER DIFFUSION LENGTH AND LIFETIME IN GAP [J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1974, 7 (13): : 1824 - 1837

[1] MEASUREMENT OF EXTRINSIC ROOM-TEMPERATURE MINORITY CARRIER LIFETIME IN GAP [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) : 500 - &

[2] DAKUS PD, 1973, APPL PHYS LETT, V22, P227

[3] KINETICS OF RECOMBINATION IN NITROGEN-DOPED GAP [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 4920 - 4930

[4] SAH CT, 1972, SOLID STATE ELECTRON, V13, P6

[5] SMITH BL, 1969, THESIS U MANCHESTER

[6] GREEN ELECTROLUMINESCENCE IN GAP DIODES AND ITS CORRELATION WITH CATHODOLUMINESCENCE MEASUREMENTS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (13) : 1622 - 1639

[7] DETERMINATION OF DEEP CENTERS IN CONDUCTING GALLIUM ARSENIDE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) : 3411 - &

[8] CONCENTRATION-DEPENDENCE OF MINORITY-CARRIER DIFFUSION LENGTH AND LIFETIME IN GAP [J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1974, 7 (13): : 1824 - 1837