ENERGY-BANDS OF RECONSTRUCTED SURFACE STATES OF CLEAVED SI

[1] SURFACE STATES AND SURFACE BONDS OF SI(111) [J]. PHYSICAL REVIEW LETTERS, 1973, 31 (02) : 106 - 109

[2] APPELBAUM JA, TO BE PUBLISHED

[3] OPTICAL ABSORPTION OF SURFACE STATES IN ULTRAHIGH VACUUM CLEAVED (111) SURFACES OF GE AND SI [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (10): : 3398 - +

[4] PHOTOEMISSION DENSITIES OF INTRINSIC SURFACE STATES FOR SI, GE, AND GAAS [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (21) : 1378 - &

[5] REALISTIC TIGHT-BINDING CALCULATIONS OF SURFACE STATES OF SI AND GE (111) [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (25) : 1433 - 1436

[6] PANDEY KC, TO BE PUBLISHED

[7] SPECTROSCOPIC ANALYSIS OF COHESIVE ENERGIES AND HEATS OF FORMATION OF TETRAHEDRALLY COORDINATED SEMICONDUCTORS [J]. PHYSICAL REVIEW B, 1970, 2 (06): : 2147 - &

[8] COVALENT SUPERLATTICE STRUCTURES AT SILICON (111) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (23) : 1315 - 1318

[9] MEASUREMENT OF ANGLE OF DANGLING-BOND PHOTOEMISSION FROM CLEAVED SILICON [J]. PHYSICAL REVIEW LETTERS, 1974, 33 (22) : 1333 - 1335

[10] SURFACE AND BULK CONTRIBUTIONS TO ULTRAVIOLET PHOTOEMISSION SPECTRA OF SILICON [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (08) : 421 - 424

[1] SURFACE STATES AND SURFACE BONDS OF SI(111) [J]. PHYSICAL REVIEW LETTERS, 1973, 31 (02) : 106 - 109

[2] APPELBAUM JA, TO BE PUBLISHED

[3] OPTICAL ABSORPTION OF SURFACE STATES IN ULTRAHIGH VACUUM CLEAVED (111) SURFACES OF GE AND SI [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (10): : 3398 - +

[4] PHOTOEMISSION DENSITIES OF INTRINSIC SURFACE STATES FOR SI, GE, AND GAAS [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (21) : 1378 - &

[5] REALISTIC TIGHT-BINDING CALCULATIONS OF SURFACE STATES OF SI AND GE (111) [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (25) : 1433 - 1436

[6] PANDEY KC, TO BE PUBLISHED

[7] SPECTROSCOPIC ANALYSIS OF COHESIVE ENERGIES AND HEATS OF FORMATION OF TETRAHEDRALLY COORDINATED SEMICONDUCTORS [J]. PHYSICAL REVIEW B, 1970, 2 (06): : 2147 - &

[8] COVALENT SUPERLATTICE STRUCTURES AT SILICON (111) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (23) : 1315 - 1318

[9] MEASUREMENT OF ANGLE OF DANGLING-BOND PHOTOEMISSION FROM CLEAVED SILICON [J]. PHYSICAL REVIEW LETTERS, 1974, 33 (22) : 1333 - 1335

[10] SURFACE AND BULK CONTRIBUTIONS TO ULTRAVIOLET PHOTOEMISSION SPECTRA OF SILICON [J]. PHYSICAL REVIEW LETTERS, 1974, 32 (08) : 421 - 424