PHOTOETCHING OF POLYCRYSTALLINE N-CDS FILM ELECTRODES IN A PHOTOELECTROCHEMICAL CELL - AN ELECTROLYTE ELECTROREFLECTANCE STUDY

被引：14

作者：

FERRER, IJ

SALVADOR, P

机构：

来源：

BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 1987年 / 91卷 / 04期

关键词：

D O I：

10.1002/bbpc.19870910427

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：374 / 378

页数：5

共 24 条

[1] THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE
ASPNES, DE
[J]. SURFACE SCIENCE, 1973, 37 (01) : 418 - 442
[2] BRILLSON LJ, 1977, SURF SCI, V69, P62, DOI 10.1016/0039-6028(77)90162-5
[3] BUBE RH, 1957, J CHEM PHYS, V27, P1013
[4] ELECTROREFLECTANCE AT A SEMICONDUCTOR-ELECTROLYTE INTERFACE
CARDONA, M
SHAKLEE, KL
POLLAK, FH
[J]. PHYSICAL REVIEW, 1967, 154 (03): : 696 - +
[5] CARDONA M, 1965, PHYS LETT, V15, P883
[6] STRUCTURAL AND OPTICAL-PROPERTIES OF RF-SPUTTERED CDS THIN-FILMS
DELAPLAZA, IM
GONZALEZDIAZ, G
SANCHEZQUESADA, F
RODRIGUEZVIDAL, M
[J]. THIN SOLID FILMS, 1984, 120 (01) : 31 - 36
[7] ON THE PHOTOELECTROCHEMICAL ETCHING OF POLYCRYSTALLINE CDS THIN-FILM ELECTRODES IN SO32-ELECTROLYTES
FERRER, IJ
SALVADOR, P
VELASCO, JG
[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1985, 189 (02): : 363 - 369
[8] DETECTION OF SURFACE-STATES ASSOCIATED WITH ADSORBED HYDROGEN-PEROXIDE ON TIO2 BY IMPEDANCE AND ELECTROLYTE ELECTROREFLECTANCE MEASUREMENTS
FERRER, IJ
MURAKI, H
SALVADOR, P
[J]. JOURNAL OF PHYSICAL CHEMISTRY, 1986, 90 (13) : 2805 - 2807
[9] DEPLETION-LAYER PHOTOEFFECTS IN SEMICONDUCTORS
GARTNER, WW
[J]. PHYSICAL REVIEW, 1959, 116 (01): : 84 - 87
[10] HAISTY RW, 1961, J ELECTROCHEM SOC, V108, P790