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PHOTOETCHING OF POLYCRYSTALLINE N-CDS FILM ELECTRODES IN A PHOTOELECTROCHEMICAL CELL - AN ELECTROLYTE ELECTROREFLECTANCE STUDY
被引:14
作者
:
FERRER, IJ
论文数:
0
引用数:
0
h-index:
0
FERRER, IJ
SALVADOR, P
论文数:
0
引用数:
0
h-index:
0
SALVADOR, P
机构
:
来源
:
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS
|
1987年
/ 91卷
/ 04期
关键词
:
D O I
:
10.1002/bbpc.19870910427
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:374 / 378
页数:5
相关论文
共 24 条
[21]
ELECTROLYTE ELECTROREFLECTANCE STUDY OF SURFACE OPTIMIZATION OF N-CULNSE2 IN PHOTOELECTROCHEMICAL SOLAR-CELLS
SHEN, WM
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
SHEN, WM
SIRIPALA, W
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
SIRIPALA, W
TOMKIEWICZ, M
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
TOMKIEWICZ, M
CAHEN, D
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
CAHEN, D
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1986,
133
(01)
: 107
-
112
[22]
OPTICAL DETERMINATION OF FERMI-LEVEL PINNING USING ELECTROREFLECTANCE
SILBERSTEIN, RP
论文数:
0
引用数:
0
h-index:
0
SILBERSTEIN, RP
POLLAK, FH
论文数:
0
引用数:
0
h-index:
0
POLLAK, FH
LYDEN, JK
论文数:
0
引用数:
0
h-index:
0
LYDEN, JK
TOMKIEWICZ, M
论文数:
0
引用数:
0
h-index:
0
TOMKIEWICZ, M
[J].
PHYSICAL REVIEW B,
1981,
24
(12):
: 7397
-
7400
[23]
EVIDENCE FOR NONUNIFORM FLOW OF CHARGE-CARRIERS THROUGH SEMICONDUCTOR JUNCTIONS
TENNE, R
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
TENNE, R
MARCU, V
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
MARCU, V
YELLIN, N
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
YELLIN, N
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(11)
: 1219
-
1221
[24]
TOMKIEWICZ M, 1984, J ELECTROCHEM SOC, V131, P736, DOI 10.1149/1.2115690
←
1
2
3
→
共 24 条
[21]
ELECTROLYTE ELECTROREFLECTANCE STUDY OF SURFACE OPTIMIZATION OF N-CULNSE2 IN PHOTOELECTROCHEMICAL SOLAR-CELLS
SHEN, WM
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
SHEN, WM
SIRIPALA, W
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
SIRIPALA, W
TOMKIEWICZ, M
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
TOMKIEWICZ, M
CAHEN, D
论文数:
0
引用数:
0
h-index:
0
机构:
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
WEIZMANN INST SCI,DEPT STRUCT CHEM,IL-76100 REHOVOT,ISRAEL
CAHEN, D
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1986,
133
(01)
: 107
-
112
[22]
OPTICAL DETERMINATION OF FERMI-LEVEL PINNING USING ELECTROREFLECTANCE
SILBERSTEIN, RP
论文数:
0
引用数:
0
h-index:
0
SILBERSTEIN, RP
POLLAK, FH
论文数:
0
引用数:
0
h-index:
0
POLLAK, FH
LYDEN, JK
论文数:
0
引用数:
0
h-index:
0
LYDEN, JK
TOMKIEWICZ, M
论文数:
0
引用数:
0
h-index:
0
TOMKIEWICZ, M
[J].
PHYSICAL REVIEW B,
1981,
24
(12):
: 7397
-
7400
[23]
EVIDENCE FOR NONUNIFORM FLOW OF CHARGE-CARRIERS THROUGH SEMICONDUCTOR JUNCTIONS
TENNE, R
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
TENNE, R
MARCU, V
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
MARCU, V
YELLIN, N
论文数:
0
引用数:
0
h-index:
0
机构:
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL
YELLIN, N
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(11)
: 1219
-
1221
[24]
TOMKIEWICZ M, 1984, J ELECTROCHEM SOC, V131, P736, DOI 10.1149/1.2115690
←
1
2
3
→