THE QUANTITATION OF ELECTRON-ENERGY LOSS SPECTRA

被引：30

作者：

JOY, DC

MAHER, DM

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 124卷 / OCT期

关键词：

D O I：

10.1111/j.1365-2818.1981.tb01303.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：37 / 48

页数：12

共 23 条

[1]

Egerton R.F., 1980, SCANNING ELECTRON MI, V1, P41

[2] FORMULAS FOR LIGHT-ELEMENT MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROMETRY [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1978, 3 (02) :243-251

[3] K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1979, 4 (02) :169-179

[4]

EGERTON RF, 1981, 39TH P ANN M EMSA

[5]

Goldstein J.I., 1979, INTRO ANAL ELECT MIC, P83

[6] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J].

ISAACSON, M ;

JOHNSON, D .

ULTRAMICROSCOPY, 1975, 1 (01) :33-52

[7]

JENGUILLAUME C, 1978, ULTRAMICROSCOPY, V3, P237

[8] ELECTRON-ENERGY LOSS SPECTROSCOPY - DETECTABLE LIMITS FOR ELEMENTAL ANALYSIS [J].

JOY, DC ;

MAHER, DM .

ULTRAMICROSCOPY, 1980, 5 (03) :333-342

[9] PRACTICAL ELECTRON SPECTROMETER FOR CHEMICAL-ANALYSIS [J].

JOY, DC ;

MAHER, DM .

JOURNAL OF MICROSCOPY-OXFORD, 1978, 114 (NOV) :117-129

[10] ELECTRON ENERGY-LOSS SPECTROSCOPY [J].

JOY, DC ;

MAHER, DM .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (03) :260-270

← 1 2 3 →