A MODEL FOR COUPLED DOPANT DIFFUSION IN SILICON

被引:8
作者
COWERN, NEB [1 ]
GODFREY, DJ [1 ]
机构
[1] GEC RES LTD,HIRST RES CTR,WEMBLEY,ENGLAND
关键词
D O I
10.1108/eb010302
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
引用
收藏
页码:59 / 63
页数:5
相关论文
共 5 条
[1]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) :1107-1118
[2]   DIFFUSION OF ION-IMPLANTED-B IN HIGH-CONCENTRATION P-DOPED AND AS-DOPED SILICON [J].
FAIR, RB ;
PAPPAS, PN .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (09) :1241-1244
[3]  
KIYAKE M, 1985, J APPL PHYS, V58, P711
[4]   DOPANT DIFFUSION IN SILICON - A CONSISTENT VIEW INVOLVING NONEQUILIBRIUM DEFECTS [J].
MATHIOT, D ;
PFISTER, JC .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (10) :3518-3530
[5]   DIFFUSION OF BORON IN HEAVILY DOPED N-TYPE AND P-TYPE SILICON [J].
WILLOUGHBY, AFW ;
EVANS, AGR ;
CHAMP, P ;
YALLUP, KJ ;
GODFREY, DJ ;
DOWSETT, MG .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (07) :2392-2397