ION-SCATTERING SPECTROSCOPY STUDIES OF ZIRCONIUM DIOXIDE THIN-FILMS PREPARED INSITU

被引：6

作者：

MARTIN, PJ

NETTERFIELD, RP

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1987年 / 10卷 / 01期

关键词：

D O I：

10.1002/sia.740100104

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：13 / 16

页数：4

共 11 条

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[9] MAGNITUDE OF THE ATOM SHIELDING EFFECT OF OXYGEN IN ION-SCATTERING SPECTROMETRY OF MAGNESIUM-SILICATE (FORSTERITE) [J].

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[10] CHARACTERIZATION OF GROWING THIN-FILMS BY INSITU ELLIPSOMETRY, SPECTRAL REFLECTANCE AND TRANSMITTANCE MEASUREMENTS, AND ION-SCATTERING SPECTROSCOPY [J].

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DUFFY, RM ;

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (11) :1995-2003

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