EVALUATION OF ZR/O/W SCHOTTKY EMITTERS FOR MICROCOLUMN APPLICATIONS

被引：16

作者：

KIM, HS

KRATSCHMER, E

YU, ML

THOMSON, MGR

CHANG, THP

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 06期

关键词：

D O I：

10.1116/1.587523

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3413 / 3417

页数：5

共 16 条

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KERN, DP ;

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[5]

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[7]

KIM HS, 1991, J VAC SCI TECHNOL B, V11, P2327

[8] SUB-40 NM RESOLUTION 1 KEV SCANNING TUNNELING MICROSCOPE FIELD-EMISSION MICROCOLUMN [J].

KRATSCHMER, E ;

KIM, HS ;

THOMSON, MGR ;

LEE, KY ;

RISHTON, SA ;

YU, ML ;

CHANG, THP .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06) :3503-3507

[9]

MCCORD MA, 1989, J VAC SCI TECHNOL B, V6, P1851

[10] ASYMMETRIC ELECTROSTATIC LENS FOR FIELD-EMISSION MICROPROBE APPLICATIONS [J].

ORLOFF, J ;

SWANSON, LW .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) :2494-2501

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