FRICTION FORCE MICROSCOPY ON CLEAN SURFACES OF NACL, NAF, AND AGBR

被引：31

作者：

HOWALD, L ^{[1
]}

LUTHI, R ^{[1
]}

MEYER, E ^{[1
]}

GERTH, G ^{[1
]}

HAEFKE, HG ^{[1
]}

OVERNEY, R ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

机构：

[1] MAX PLANCK INST MICROSTRUCT PHYS,D-01620 HALLE,GERMANY

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587747

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

With a bidirectional atomic force microscope, measurements are performed on insulating surfaces of ionic crystals, such as NaF, NaCl, and AgBr. Atomic-scale friction is observed on surfaces, and is being prepared and studied in ultrahigh vacuum, where contaminants can be excluded. Comparative measurements show the favorable frictional properties of NaCl.

引用

页码：2227 / 2230

页数：4

共 26 条

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