CHEMICAL-ANALYSIS OF SURFACE BY FLUORESCENT X-RAY SPECTROSCOPY USING RHEED-SSD METHOD

被引：49

作者：

INO, S

ICHIKAWA, T

OKADA, S

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1980年 / 19卷 / 08期

关键词：

D O I：

10.1143/JJAP.19.1451

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1451 / 1457

页数：7

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