TEST FOR LATERAL NONUNIFORMITIES IN MOS DEVICES USING ONLY CAPACITANCE CURVES

被引：27

作者：

BREWS, JR ^{[1
]}

LOPEZ, AD ^{[1
]}

机构：

[1] BELL TELE LABS,MURRAY HILL,NJ 07974

来源：

SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 11期

关键词：

D O I：

10.1016/0038-1101(73)90082-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1267 / 1277

页数：11

共 29 条

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