DYNAMIC MICROMAGNETIC FIELD MEASUREMENT BY STROBOSCOPIC ELECTRON-BEAM TOMOGRAPHY

被引：17

作者：

SHINADA, H ^{[1
]}

FUKUHARA, S ^{[1
]}

SEITOU, S ^{[1
]}

TODOKORO, H ^{[1
]}

OTOMO, S ^{[1
]}

TAKANO, H ^{[1
]}

SHIIKI, K ^{[1
]}

机构：

[1] HITACHI LTD,NAKA WORKS,KATSUTA,IBARAKI 312,JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 02期

关键词：

D O I：

10.1109/20.123854

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a stroboscopic electron beam tomography system for measuring the dynamic micromagnetic field of recording heads. A pulsed electron beam, which is synchronized with the recording head driver, is scanned along the recording head surface from all directions. Integration of the magnetic field intensity along the beam path is calculated from the electron beam deflection angle. Intensity distributions of the dynamic magnetic field are calculated using a tomographic reconstruction algorithm. To obtain enough current even in pulsed electron beam operation, a high-brightness Ti/W thermal field emitter is used. This system was successfully applied in measuring the field distributions of a thin-film recording head, with 0.1-mu-m spatial resolution and 1 ns time resolution at an operation frequency of 30 MHz.

引用

页码：1017 / 1023

页数：7

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