SCHOTTKY DIODES WITH HIGH SERIES RESISTANCE - A SIMPLE METHOD OF DETERMINING THE BARRIER HEIGHTS

被引：10

作者：

BRUTSCHER, N

HOHEISEL, M

机构：

[1] Siemens AG Research Lab, Munich, West Ger, Siemens AG Research Lab, Munich, West Ger

来源：

SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 01期

关键词：

D O I：

10.1016/0038-1101(88)90089-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：87 / 89

页数：3

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