DETERMINATION OF LATTICE MISMATCH IN GA1-XALXAS LPE LAYER ON GAAS SUBSTRATE BY USING A DIVERGENT X-RAY SOURCE

被引：8

作者：

CHANG, SL

PATEL, NB

NANNICHI, Y

PRINCE, FCD

机构：

[1] Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas, 13.100-Campinas, S.P.

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 04期

关键词：

D O I：

10.1063/1.326179

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new method of determining lattice mismatch in LPE heterojunction systems has been developed by utilizing a divergent x-ray source. The experimental arrangements and operation procedures are much simpler than those of the usual x-ray methods.

引用

页码：2975 / 2976

页数：2

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