DETERMINATION OF MINORITY CARRIER LIFETIME AND SURFACE RECOMBINATION VELOCITY FROM TRANSIENT-RESPONSE OF MOS CAPACITORS

被引：16

作者：

KANO, Y

SHIBATA, A

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1972年 / 11卷 / 08期

关键词：

D O I：

10.1143/JJAP.11.1161

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1161 / +

页数：1

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