BULK LIFETIME DETERMINATION USING AN MOS CAPACITOR

被引：18

作者：

HUANG, JST

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1970年 / 58卷 / 11期

关键词：

D O I：

10.1109/PROC.1970.8033

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1849 / +

页数：1

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[J]. SOLID-STATE ELECTRONICS, 1965, 8 (02) : 145 - +
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