CURRENT CONFINEMENT AND LEAKAGE CURRENTS IN PLANAR BURIED-RIDGE-STRUCTURE LASER-DIODES ON N-SUBSTRATE

被引：22

作者：

AMANN, MC

THULKE, W

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 07期

关键词：

D O I：

10.1109/3.29300

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：1595 / 1602

页数：8

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