NONPLANAR AND NONCONTINUOUS BURIED LAYERS OF SIO2 IN SILICON FORMED BY ION-BEAM SYNTHESIS

被引:16
作者
HEMMENT, PLF
REESON, KJ
ROBINSON, AK
KILNER, JA
CHATER, RJ
MARSH, CD
CHRISTENSEN, KN
DAVIS, JR
机构
[1] UNIV OXFORD,OXFORD,ENGLAND
[2] UNIV LONDON IMPERIAL COLL SCI & TECHNOL,LONDON SW7 2AZ,ENGLAND
[3] BRITISH TELECOM,RES LABS,MARTLESHAM HEATH,ENGLAND
关键词
D O I
10.1016/0168-583X(89)90294-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:766 / 769
页数:4
相关论文
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