LASER VAPORIZATION-FTMS AS A PROBE OF SILICON SURFACE REACTIVITY

被引：14

作者：

CREASY, WR ^{[1
]}

MCELVANY, SW ^{[1
]}

机构：

[1] USN,RES LAB,DIV CHEM CODE 6111,WASHINGTON,DC 20375

来源：

SURFACE SCIENCE | 1988年 / 201卷 / 1-2期

关键词：

D O I：

10.1016/0039-6028(88)90597-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：59 / 74

页数：16

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