ELECTRON MICROSCOPICAL REPLICA TECHNIQUES FOR THE STUDY OF ORGANIC SURFACES

被引：26

作者：

BARNES, RB

BURTON, CJ

SCOTT, RG

机构：

来源：

关键词：

D O I：

10.1063/1.1707528

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：730 / 739

页数：10

共 14 条

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Burton, CJ
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[2] The electron microscope - Calibration and use at low magnifications
Burton, CJ
Barnes, RB
Rochow, TG
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[3] HARDY JI, 7 WILDL CIRC
[4] Fine structure of metallic surfaces with the electron microscope
Heidenreich, RD
Peck, VG
[J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) : 23 - 29
[5] TECHNIQUES IN APPLIED ELECTRON MICROSCOPY
HEIDENREICH, RD
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1945, 35 (02) : 139 - 148
[6] Electron microscope study of surface structure
Heidenreich, RD
Peck, VG
[J]. PHYSICAL REVIEW, 1942, 62 (5/6): : 292 - 293
[7] Electron microscopic determination of surface elevations and orientations
Heidenreich, RD
Matheson, LA
[J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) : 423 - 435
[8] KNOLL M, 1935, Z TECH PHYS, V16, P489
[9] MAHL H, 1940, JB AEG FORSCHUNG, V17, P67
[10] MAHL H, 1940, Z TECH PHYS, V21, P17