NEW C-2X8 UNIT-CELL FOR THE GE(111) SURFACE

[1] SURFACE PHOTOVOLTAGE SPECTROSCOPY OF ELECTRONIC SURFACE STATES ON CLEAVED GERMANIUM (111) SURFACES [J]. SURFACE SCIENCE, 1975, 50 (02) : 451 - 464

[2] CHIANG CK, UNPUBLISHED

[3] SURFACE OPTICAL-CONSTANTS OF SILICON AND GERMANIUM DERIVED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY [J]. PHYSICAL REVIEW B, 1975, 11 (12): : 4980 - 4988

[4] PHOTOEMISSION YIELD SPECTROSCOPY OF ELECTRONIC SURFACE-STATES ON GERMANIUM (111) SURFACES [J]. SURFACE SCIENCE, 1979, 85 (02) : 326 - 334

[5] CORRELATION BETWEEN SURFACE STRUCTURE AND SURFACE STATES AT CLEAN GERMANIUM-(111) SURFACE [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (09) : 3758 - &

[6] DIFFUSE-SCATTERING FROM GE(111) SURFACE AT HIGH-TEMPERATURE [J]. SOLID STATE COMMUNICATIONS, 1980, 34 (05) : 349 - 353

[7] DOUBLE DIFFRACTION SPOTS IN RHEED PATTERNS FROM CLEAN GE(111) AND SI(001) SURFACES [J]. SURFACE SCIENCE, 1979, 85 (02) : 221 - 243

[8] OBSERVATIONS OF CLEAN SURFACES OF SI GE AND GAAS BY LOW-ENERGY ELECTRON DIFFRACTION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (5-6) : 375 - &

[9] STRUCTURES OF CLEAN SURFACES OF GERMANIUM AND SILICON .1. [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (05) : 1403 - &

[10] PHOTOEMISSION MEASUREMENTS OF SURFACE STATES FOR CLEAVED AND ANNEALED GE(111) SURFACES [J]. PHYSICAL REVIEW B, 1975, 12 (06): : 2424 - 2426

[1] SURFACE PHOTOVOLTAGE SPECTROSCOPY OF ELECTRONIC SURFACE STATES ON CLEAVED GERMANIUM (111) SURFACES [J]. SURFACE SCIENCE, 1975, 50 (02) : 451 - 464

[2] CHIANG CK, UNPUBLISHED

[3] SURFACE OPTICAL-CONSTANTS OF SILICON AND GERMANIUM DERIVED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY [J]. PHYSICAL REVIEW B, 1975, 11 (12): : 4980 - 4988

[4] PHOTOEMISSION YIELD SPECTROSCOPY OF ELECTRONIC SURFACE-STATES ON GERMANIUM (111) SURFACES [J]. SURFACE SCIENCE, 1979, 85 (02) : 326 - 334

[5] CORRELATION BETWEEN SURFACE STRUCTURE AND SURFACE STATES AT CLEAN GERMANIUM-(111) SURFACE [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (09) : 3758 - &

[6] DIFFUSE-SCATTERING FROM GE(111) SURFACE AT HIGH-TEMPERATURE [J]. SOLID STATE COMMUNICATIONS, 1980, 34 (05) : 349 - 353

[7] DOUBLE DIFFRACTION SPOTS IN RHEED PATTERNS FROM CLEAN GE(111) AND SI(001) SURFACES [J]. SURFACE SCIENCE, 1979, 85 (02) : 221 - 243

[8] OBSERVATIONS OF CLEAN SURFACES OF SI GE AND GAAS BY LOW-ENERGY ELECTRON DIFFRACTION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (5-6) : 375 - &

[9] STRUCTURES OF CLEAN SURFACES OF GERMANIUM AND SILICON .1. [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (05) : 1403 - &

[10] PHOTOEMISSION MEASUREMENTS OF SURFACE STATES FOR CLEAVED AND ANNEALED GE(111) SURFACES [J]. PHYSICAL REVIEW B, 1975, 12 (06): : 2424 - 2426