ANALOG FAULT IDENTIFICATION BASED ON POWER-SUPPLY CURRENT SPECTRUM

被引:15
作者
PAPAKOSTAS, DK
HATZOPOULOS, AA
机构
[1] Aristotle University of Thessaloniki, Department of Electrical Engineering, Division of Electronic and Computer Engineering
关键词
ANALOG CIRCUITS; FAULT DIAGNOSIS;
D O I
10.1049/el:19930077
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A fault dictionary approach using power supply current spectrum measurements for fault location in analogue active circuits is presented. A discrimination factor is introduced for efficient fault identification. Representative results using an active filter example are given, showing the effectiveness of the proposed technique.
引用
收藏
页码:118 / 119
页数:2
相关论文
共 5 条
[1]   SUPPLY CURRENT TESTING OF MIXED ANALOG AND DIGITAL ICS [J].
BELL, IM ;
CAMPLIN, DA ;
TAYLOR, GE ;
BANNISTER, BR .
ELECTRONICS LETTERS, 1991, 27 (17) :1581-1583
[2]   QUIESCENT POWER-SUPPLY CURRENT MEASUREMENT FOR CMOS IC DEFECT DETECTION [J].
HAWKINS, CF ;
SODEN, JM ;
FRITZEMEIER, RR ;
HORNING, LK .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 1989, 36 (02) :211-218
[3]   FAULT-DETECTION METHOD USING POWER-SUPPLY SPECTRUM ANALYSIS [J].
LEE, P ;
OLEARY, P .
ELECTRONICS LETTERS, 1990, 26 (20) :1733-1734
[4]   SELF-TESTING CMOS OPERATIONAL-AMPLIFIER [J].
ROCA, M ;
RUBIO, A .
ELECTRONICS LETTERS, 1992, 28 (15) :1452-1454
[5]   QUIESCENT CURRENT SENSOR CIRCUITS IN DIGITAL VLSI CMOS TESTING [J].
RUBIO, A ;
FIGUERAS, J ;
SEGURA, J .
ELECTRONICS LETTERS, 1990, 26 (15) :1204-1206