MEASUREMENT OF THE THICKNESS OF THE SURFACE-LAYER ON AMORPHOUS-GE FILMS USING SPECTROSCOPIC ELLIPSOMETRY - VALIDITY OF EFFECTIVE MEDIUM MODELING

被引：10

作者：

MCMARR, PJ ^{[1
]}

BLANCO, JR ^{[1
]}

机构：

[1] CALIF STATE UNIV NORTHRIDGE, DEPT PHYS & ASTRON, NORTHRIDGE, CA 91330 USA

来源：

APPLIED OPTICS | 1988年 / 27卷 / 20期

关键词：

D O I：

10.1364/AO.27.004265

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：4265 / 4273

页数：9

相关论文

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