DENSITY OF AMORPHOUS-GERMANIUM FILMS BY SPECTROSCOPIC ELLIPSOMETRY

被引:39
作者
BLANCO, JR
MCMARR, PJ
YEHODA, JE
VEDAM, K
MESSIER, R
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期
关键词
D O I
10.1116/1.573851
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
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页码:577 / 582
页数:6
相关论文
共 48 条
[1]   OPTICAL CHARACTERIZATION OF THIN-FILMS [J].
ANDERSON, WJ ;
HANSEN, WN .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (08) :1051-1058
[2]   AN INVESTIGATION OF ION-BOMBARDED AND ANNEALED (111) SURFACES OF GE BY SPECTROSCOPIC ELLIPSOMETRY [J].
ASPNES, DE ;
STUDNA, AA .
SURFACE SCIENCE, 1980, 96 (1-3) :294-306
[3]   OPTICAL-PROPERTIES OF AU - SAMPLE EFFECTS [J].
ASPNES, DE ;
KINSBRON, E ;
BACON, DD .
PHYSICAL REVIEW B, 1980, 21 (08) :3290-3299
[4]   HIGH PRECISION SCANNING ELLIPSOMETER [J].
ASPNES, DE ;
STUDNA, AA .
APPLIED OPTICS, 1975, 14 (01) :220-228
[5]   INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J].
ASPNES, DE ;
THEETEN, JB .
PHYSICAL REVIEW B, 1979, 20 (08) :3292-3302
[6]   OPTICAL-PROPERTIES OF THIN-FILMS [J].
ASPNES, DE .
THIN SOLID FILMS, 1982, 89 (03) :249-262
[7]  
ASPNES DE, 1981, SPIE P, V276, P188
[8]  
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[9]   OPTICAL-PROPERTIES OF LPCVD AB(H) [J].
BAGLEY, BG ;
ASPNES, DE ;
ADAMS, AC ;
BENENSON, RE .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) :441-446
[10]   OPTICAL-PROPERTIES OF LOW-PRESSURE CHEMICALLY VAPOR-DEPOSITED SILICON OVER THE ENERGY-RANGE 3.0-EV-6.0-EV [J].
BAGLEY, BG ;
ASPNES, DE ;
ADAMS, AC ;
MOGAB, CJ .
APPLIED PHYSICS LETTERS, 1981, 38 (01) :56-58