DELOCALIZED SECONDARY-ELECTRON GENERATION STUDIED BY MOMENTUM-RESOLVED COINCIDENCE-ELECTRON SPECTROSCOPY

被引：8

作者：

DRUCKER, J ^{[1
]}

SCHEINFEIN, MR ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS & ASTRON,TEMPE,AZ 85287

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.47.15973

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The delocalization of the secondary-electron generation process is studied using momentum-resolved coincidence-electron spectroscopy in an ultrahigh-vacuum scanning transmission electron microscope. Secondary electrons are more efficiently produced by the decay of excitations resulting from large-momentum-transfer spatially localized) inelastic scattering. The fraction of secondary electrons resulting from localized excitations can explain the high spatial resolution observed in secondary-electron microscopy images.

引用

页码：15973 / 15975

页数：3

共 26 条

[1]

BINDI R, 1987, SCANNING MICROSCOPY, V1, P1475

[2] HIGH-RESOLUTION SECONDARY-ELECTRON IMAGING AND SPECTROSCOPY [J].