The effects of electron- and ion-beam irradiation on the mechanical response of silicon microresonators

被引:2
作者
Mihailovich, RE [1 ]
MacDonald, NC [1 ]
机构
[1] CORNELL UNIV,DEPT ELECT ENGN,ITHACA,NY 14853
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 06期
关键词
D O I
10.1116/1.588390
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated the mechanical response of silicon microresonators exposed to electron- and ion-beam irradiation. The microresonators were single-crystal silicon structures consisting of beams similar to 0.7 mu m wide, and having preirradiation frequency of 48 kHz and Q(-1) of 2.5x10(-5). For the electron-beam experiment, microresonator response was measured after 10 min irradiations with 10 keV electrons, for beam currents ranging from 2 to 20 nA. The frequency shows a monotonic increase with electron dose, while the Q(-1) shows a peak versus dose. For the ion-beam experiment, the microresonator was irradiated with 3.5 keV Ar+ ions for timed intervals up to 10 min. The microresonator frequency and Q(-1) exhibit extrema versus irradiation time. These mechanical-response changes are significant for both electron- and ion-irradiation experiments, with frequency shifts similar to 0.1% and Q(-1) changes of a factor similar to 3. (C) 1995 American Vacuum Society.
引用
收藏
页码:2545 / 2549
页数:5
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