APPLICATION OF AUGER AND CHARACTERISTIC LOSS SPECTROSCOPIES TO STUDY OF ELECTRONIC-STRUCTURE OF TI AND TIO2

被引：29

作者：

KNOTEK, ML ^{[1
]}

HOUSTON, JE ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

PHYSICAL REVIEW B | 1977年 / 15卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.15.4580

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4580 / 4586

页数：7

共 33 条

[11] IONIZATION SPECTROSCOPY OF SURFACES
GERLACH, RL
HOUSTON, JE
PARK, RL
[J]. APPLIED PHYSICS LETTERS, 1970, 16 (04) : 179 - &
[12] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 227 - 230
[13] OBSERVATION OF 2-DIMENSIONAL PHASES ASSOCIATED WITH DEFECT STATES ON SURFACE OF TIO-2
HENRICH, VE
DRESSELHAUS, G
ZEIGER, HJ
[J]. PHYSICAL REVIEW LETTERS, 1976, 36 (22) : 1335 - 1339
[14] VALENCE-BAND DENSITY OF STATES FOR SI AND SIO2 USING AUGER-ELECTRON SPECTROSCOPY
HOUSTON, JE
LAGALLY, MG
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 361 - 361
[15] VALENCE-BAND STRUCTURE IN AUGER SPECTRUM OF ALUMINUM
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 255 - 259
[16] INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION
HOUSTON, JE
PARK, RL
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) : 1437 - &
[17] HOUSTON JE, 1971, J CHEM PHYS, V155, P4601
[18] ELECTRONIC-STRUCTURE AND MAGNETIC BREAKDOWN IN TITANIUM
JEPSEN, O
[J]. PHYSICAL REVIEW B, 1975, 12 (08): : 2988 - 2997
[19] Keski-Rahkonen O., 1974, Atomic Data and Nuclear Data Tables, V14, P139, DOI 10.1016/S0092-640X(74)80020-3
[20] SELECTION-RULE EFFECTS IN ELECTRON-LOSS SPECTROSCOPY OF GE AND GAAS SURFACES
LUDEKE, R
KOMA, A
[J]. PHYSICAL REVIEW LETTERS, 1975, 34 (13) : 817 - 821