MEASUREMENTS OF THE STOPPING POWER OF 40-KEV TO 300-KEV PROTONS IN SILICON

被引:9
作者
KUHRT, E
LENKEIT, K
TAUBNER, F
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 66卷 / 02期
关键词
D O I
10.1002/pssa.2210660260
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K131 / K133
页数:3
相关论文
共 8 条
[1]   THEORY OF CHARGED PARTICLES IN SEMICONDUCTORS [J].
BRANDT, W ;
REINHEIMER, J .
CANADIAN JOURNAL OF PHYSICS, 1968, 46 (06) :607-+
[2]  
CARNERA A, 1978, PHYS REV B, V17, P3492, DOI 10.1103/PhysRevB.17.3492
[3]   DETERMINATION OF RANDOM AND ALIGNED STOPPING POWERS FOR 80-300 KEV PROTONS IN SILICON BY BACKSCATTERING MEASUREMENTS [J].
CEMBALI, F ;
ZIGNANI, F .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1977, 31 (03) :169-173
[4]  
DELLAMEA G, 1975, ATOMIC COLLISIONS SO, P75
[5]   MEASUREMENTS OF THE RATIO BETWEEN PLANAR AND RANDOM STOPPING POWER FOR 80 TO 300 KEV PROTONS IN SILICON [J].
KUHRT, E ;
TAUBNER, F .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 61 (02) :513-519
[6]  
Scherzer BMU, 1976, ION BEAM SURFACE LAY, P33
[7]  
Sirotinin E. I., 1972, RADIAT EFF, V15, P149, DOI DOI 10.1080/00337577208234688
[8]   DEFINING RANDOM SPECTRUM AS USED IN CHANNELING TECHNIQUE OF NUCLEAR BACKSCATTERING [J].
ZIEGLER, JF ;
CROWDER, BL .
APPLIED PHYSICS LETTERS, 1972, 20 (04) :178-&