THEORETICAL ATOMIC-FORCE-MICROSCOPY STUDY OF ADSORBED FULLERENE MOLECULES

被引:12
作者
GIRARD, C
BOUJU, X
MARTIN, OJF
DEREUX, A
CHAVY, C
TANG, H
JOACHIM, C
机构
[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
[2] FAC UNIV NOTRE DAME PAIX,INST STUDIES INTERFACE SCI,B-5000 NAMUR,BELGIUM
[3] CTR ELABORAT MAT & ETUD STRUCT,F-31055 TOULOUSE,FRANCE
来源
PHYSICAL REVIEW B | 1993年 / 48卷 / 20期
关键词
D O I
10.1103/PhysRevB.48.15417
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The capability of atomic-force microscopy (AFM) to localize both individual adsorbates and aggregates of adsorbed molecules was demonstrated a few years ago. More recently submonolayers of fullerene molecules deposited on a gold Substrate have been imaged using such devices. In this paper, simulations of the atomic force between a thin probe tip and a set of adsorbed molecules is presented. The long-range part of the interaction is determined from a whole self-consistent procedure in which many-body effects are accounted for at all orders. In this description the probe tip interacts with the molecules and the surface through many-body dispersion forces. Short-range interactions are then included by using an atom-atom semiempirical pairwise potential. Simulations of AFM images of C-60 adsorbed molecules are presented in two different modes of imaging: the constant-tip-height mode and the constant-force mode.
引用
收藏
页码:15417 / 15424
页数:8
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