SIZE AND PACKING OF FULLERENES ON C60/C70 CRYSTAL-SURFACES STUDIED BY ATOMIC FORCE MICROSCOPY

被引:35
作者
DIETZ, P [1 ]
FOSTIROPOULOS, K [1 ]
KRATSCHMER, W [1 ]
HANSMA, PK [1 ]
机构
[1] MAX PLANCK INST NUCL PHYS,W-6900 HEIDELBERG 1,GERMANY
关键词
D O I
10.1063/1.107374
中图分类号
O59 [应用物理学];
学科分类号
摘要
Atomic force microscopy was used to image C60/C70 crystal surfaces under ethanol with resolution of single molecules. Spherical and elongated elliptical fullerenes were observed which most likely correspond with C60 respectively C70. Measurements of the maximum diameter for a large number of molecules confirm the presence of two species of fullerenes, one with 9.4 angstrom, the other with 11.2 angstrom. The observed ratio C60:C70 is 81:19, in good agreement with spectroscopical data. The molecules are arranged either in hexagonal or cubic packing; in some areas the two arrangements alternate within a few nm. Elongated fullerenes appear to prefer the hexagonal packing.
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页码:62 / 64
页数:3
相关论文
共 16 条
[1]  
AIJE H, 1990, J PHYS CHEM-US, V94, P8630
[2]   ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274
[3]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[4]  
GUO YJ, 1991, NATURE, V351, P464, DOI 10.1038/351464a0
[5]   SOLID C-60 - A NEW FORM OF CARBON [J].
KRATSCHMER, W ;
LAMB, LD ;
FOSTIROPOULOS, K ;
HUFFMAN, DR .
NATURE, 1990, 347 (6291) :354-358
[6]   THE INFRARED AND ULTRAVIOLET-ABSORPTION SPECTRA OF LABORATORY-PRODUCED CARBON DUST - EVIDENCE FOR THE PRESENCE OF THE C-60 MOLECULE [J].
KRATSCHMER, W ;
FOSTIROPOULOS, K ;
HUFFMAN, DR .
CHEMICAL PHYSICS LETTERS, 1990, 170 (2-3) :167-170
[7]   IMAGING METAL ATOMS IN AIR AND WATER USING THE ATOMIC FORCE MICROSCOPE [J].
MANNE, S ;
BUTT, HJ ;
GOULD, SAC ;
HANSMA, PK .
APPLIED PHYSICS LETTERS, 1990, 56 (18) :1758-1759
[8]   CORRECTION [J].
MEYER, G .
APPLIED PHYSICS LETTERS, 1988, 53 (24) :2400-2400
[9]   ATOMIC FORCE MICROSCOPY OF BIOLOGICAL SAMPLES AT LOW-TEMPERATURE [J].
PRATER, CB ;
WILSON, MR ;
GARNAES, J ;
MASSIE, J ;
ELINGS, VB ;
HANSMA, PK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :989-991
[10]   ATOMIC FORCE MICROSCOPY [J].
RUGAR, D ;
HANSMA, P .
PHYSICS TODAY, 1990, 43 (10) :23-30