ATOMIC FORCE MICROSCOPY

被引：568

作者：

RUGAR, D ^{[1
]}

HANSMA, P ^{[1
]}

机构：

[1] UNIV CALIF SANTA BARBARA,PHYS,SANTA BARBARA,CA 93106

来源：

PHYSICS TODAY | 1990年 / 43卷 / 10期

关键词：

D O I：

10.1063/1.881238

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

It is surprisingly easy to make a cantilever with a spring constant weaker than the equivalent spring between atoms, allowing a sharp tip to image both conducting and nonconducting samples at atomic resolution. © 1975, American Association of Physics Teachers. All rights reserved.

引用

收藏

页码：23 / 30

页数：8

相关论文

共 38 条

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