ATOMIC FORCE MICROSCOPY OF C60/C70 SINGLE-CRYSTAL FULLERENES UNDER ETHANOL

被引:13
作者
DIETZ, P
HANSMA, P
FOSTIROPOULOS, K
KRATSCHMER, W
机构
[1] UNIV CALIF SANTA BARBARA,DEPT PHYS,SANTA BARBARA,CA 93106
[2] MAX PLANCK INST NUCL PHYS,W-6900 HEIDELBERG 1,GERMANY
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1993年 / 56卷 / 03期
关键词
D O I
10.1007/BF00539475
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
C60/C70 crystal surfaces were imaged by atomic force microscopy under ethanol with resolution of single molecules. Spherical and elongated elliptical fullerenes can be distinguished corresponding most likely with C60, respectively C70. Determination of the maximum diameter for a large number of molecules confirms the presence of two species of fullerenes, one with 9.4 angstrom, the other with 11.2 angstrom. The measured ratio C60:C70 is 81:19 which resembles the spectroscopical data. The molecules are arranged either in hexagonal (hcp) or cubic (fcc) packing, in some areas the two arrangements alternate within a few nm. Elongated fullerenes apparently prefer the hexagonal packing.
引用
收藏
页码:207 / 210
页数:4
相关论文
共 19 条
  • [1] AIJE H, 1990, J PHYS CHEM-US, V94, P8630
  • [2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS
    ALBRECHT, TR
    QUATE, CF
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 271 - 274
  • [3] AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER
    ALEXANDER, S
    HELLEMANS, L
    MARTI, O
    SCHNEIR, J
    ELINGS, V
    HANSMA, PK
    LONGMIRE, M
    GURLEY, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) : 164 - 167
  • [4] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [5] SIZE AND PACKING OF FULLERENES ON C60/C70 CRYSTAL-SURFACES STUDIED BY ATOMIC FORCE MICROSCOPY
    DIETZ, P
    FOSTIROPOULOS, K
    KRATSCHMER, W
    HANSMA, PK
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (01) : 62 - 64
  • [6] TRANSMISSION ELECTRON-MICROSCOPY OF CHROMATOGRAPHICALLY PURIFIED SOLID-STATE C60 AND C70
    DRAVID, VP
    LIU, SZ
    KAPPES, MM
    [J]. CHEMICAL PHYSICS LETTERS, 1991, 185 (1-2) : 75 - 81
  • [7] GUO YJ, 1991, NATURE, V351, P464, DOI 10.1038/351464a0
  • [8] SOLID C-60 - A NEW FORM OF CARBON
    KRATSCHMER, W
    LAMB, LD
    FOSTIROPOULOS, K
    HUFFMAN, DR
    [J]. NATURE, 1990, 347 (6291) : 354 - 358
  • [9] THE INFRARED AND ULTRAVIOLET-ABSORPTION SPECTRA OF LABORATORY-PRODUCED CARBON DUST - EVIDENCE FOR THE PRESENCE OF THE C-60 MOLECULE
    KRATSCHMER, W
    FOSTIROPOULOS, K
    HUFFMAN, DR
    [J]. CHEMICAL PHYSICS LETTERS, 1990, 170 (2-3) : 167 - 170
  • [10] IMAGING METAL ATOMS IN AIR AND WATER USING THE ATOMIC FORCE MICROSCOPE
    MANNE, S
    BUTT, HJ
    GOULD, SAC
    HANSMA, PK
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (18) : 1758 - 1759