NEW CONCEPTS FOR ELECTRON-ION BEAM AND ELECTRON-ELECTRON BEAM MEMORIES

[1] SPATIAL DISTRIBUTION OF FLUORESCENT RADIATION EMISSION CAUSED BY AN ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) : 3767 - +

[2] DROHN VE, 1975, APPL PHYS LETT, V27, P479

[3] FURUKAWA S, 1973, 3RD INT C ION IMPL S, P193

[4] GOLDENBERG AH, 1951, BRIT J APPL PHYS, V2, P233

[5] HARPER FE, 1970, SOLID STATE ELECTRON, P1103

[6] INFORMATION-STORAGE DEVICE USING SURFACE DIODES [J]. APPLIED PHYSICS LETTERS, 1977, 30 (11) : 592 - 594

[7] THIN-FILMS AND SOLID-PHASE REACTIONS [J]. SCIENCE, 1975, 190 (4211) : 228 - 234

[8] CHANNELING STUDY OF BORON-IMPLANTED SILICON [J]. APPLIED PHYSICS LETTERS, 1970, 16 (03) : 126 - &

[9] ORLOFF J, 1977, 10TH P ANN SEM S CHI

[10] BIT PACKING DENSITY OF BEAMOS TARGET [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (12) : 5245 - 5261

[1] SPATIAL DISTRIBUTION OF FLUORESCENT RADIATION EMISSION CAUSED BY AN ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) : 3767 - +

[2] DROHN VE, 1975, APPL PHYS LETT, V27, P479

[3] FURUKAWA S, 1973, 3RD INT C ION IMPL S, P193

[4] GOLDENBERG AH, 1951, BRIT J APPL PHYS, V2, P233

[5] HARPER FE, 1970, SOLID STATE ELECTRON, P1103

[6] INFORMATION-STORAGE DEVICE USING SURFACE DIODES [J]. APPLIED PHYSICS LETTERS, 1977, 30 (11) : 592 - 594

[7] THIN-FILMS AND SOLID-PHASE REACTIONS [J]. SCIENCE, 1975, 190 (4211) : 228 - 234

[8] CHANNELING STUDY OF BORON-IMPLANTED SILICON [J]. APPLIED PHYSICS LETTERS, 1970, 16 (03) : 126 - &

[9] ORLOFF J, 1977, 10TH P ANN SEM S CHI

[10] BIT PACKING DENSITY OF BEAMOS TARGET [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (12) : 5245 - 5261