THIN-FILMS AND SOLID-PHASE REACTIONS

[1] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04): : 481 - &

[2] INVESTIGATION OF LOW-ENERGY ION SCATTERING AS A SURFACE ANALYTICAL TECHNIQUE [J]. SURFACE SCIENCE, 1972, 30 (01) : 69 - &

[3] CHARACTERIZATION OF SILICON METALLIZATION SYSTEMS USING ENERGETIC ION BACKSCATTERING [J]. PROCEEDINGS OF THE IEEE, 1974, 62 (09) : 1224 - 1231

[4] BOWER RW, 1973, APPL PHYS LETT, V23, P99, DOI 10.1063/1.1654823

[5] GROWTH KINETICS OBSERVED IN FORMATION OF METAL SILICIDES ON SILICON [J]. APPLIED PHYSICS LETTERS, 1972, 20 (09) : 359 - &

[6] ASSESSMENT OF ION-INDUCED X-RAYS FOR ANALYSIS [J]. THIN SOLID FILMS, 1973, 19 (01) : 91 - 102

[7] KINETICS OF PHASE FORMATION IN AU-AL THIN-FILMS [J]. PHILOSOPHICAL MAGAZINE, 1975, 31 (04): : 903 - 917

[8] MEASUREMENT OF SOLUBILITY OF GERMANIUM IN ALUMINUM UTILIZING MEV HE+ BACKSCATTERING [J]. METALLURGICAL TRANSACTIONS, 1973, 4 (03): : 735 - 743

[9] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +

[10] IDENTIFICATION OF DOMINANT DIFFUSING SPECIES IN SILICIDE FORMATION [J]. APPLIED PHYSICS LETTERS, 1974, 25 (08) : 454 - 457

[1] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04): : 481 - &

[2] INVESTIGATION OF LOW-ENERGY ION SCATTERING AS A SURFACE ANALYTICAL TECHNIQUE [J]. SURFACE SCIENCE, 1972, 30 (01) : 69 - &

[3] CHARACTERIZATION OF SILICON METALLIZATION SYSTEMS USING ENERGETIC ION BACKSCATTERING [J]. PROCEEDINGS OF THE IEEE, 1974, 62 (09) : 1224 - 1231

[4] BOWER RW, 1973, APPL PHYS LETT, V23, P99, DOI 10.1063/1.1654823

[5] GROWTH KINETICS OBSERVED IN FORMATION OF METAL SILICIDES ON SILICON [J]. APPLIED PHYSICS LETTERS, 1972, 20 (09) : 359 - &

[6] ASSESSMENT OF ION-INDUCED X-RAYS FOR ANALYSIS [J]. THIN SOLID FILMS, 1973, 19 (01) : 91 - 102

[7] KINETICS OF PHASE FORMATION IN AU-AL THIN-FILMS [J]. PHILOSOPHICAL MAGAZINE, 1975, 31 (04): : 903 - 917

[8] MEASUREMENT OF SOLUBILITY OF GERMANIUM IN ALUMINUM UTILIZING MEV HE+ BACKSCATTERING [J]. METALLURGICAL TRANSACTIONS, 1973, 4 (03): : 735 - 743

[9] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +

[10] IDENTIFICATION OF DOMINANT DIFFUSING SPECIES IN SILICIDE FORMATION [J]. APPLIED PHYSICS LETTERS, 1974, 25 (08) : 454 - 457