THIN-FILMS AND SOLID-PHASE REACTIONS

[11] COMPARISON OF BACKSCATTERING SPECTROMETRY AND SECONDARY ION MASS-SPECTROMETRY BY ANALYSIS OF TANTALUM PENTOXIDE LAYERS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (14) : 2136 - 2141

[12] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[13] EFFECT OF GRADIENT ENERGY ON DIFFUSION IN GOLD-SILVER ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (05) : 2191 - +

[14] LOW-TEMPERATURE INTERDIFFUSION IN AU-PD AND AU-RH THIN-FILM COUPLES [J]. THIN SOLID FILMS, 1975, 25 (02) : 441 - 448

[15] An X-ray method of determining rates of diffusion in the solid state [J]. JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) : 357 - 365

[16] Selective x-ray diffraction from artificially stratified metal films deposited by evaporation [J]. PHYSICAL REVIEW, 1935, 48 (08): : 703 - 703

[17] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[18] FEDER R, 1972, J APPL PHYS, V43, P3283

[19] GRAIN-BOUNDARY SELF-DIFFUSION IN AU BY AR SPUTTERING TECHNIQUE [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4455 - 4458

[20] HALL PM, IN PRESS

[11] COMPARISON OF BACKSCATTERING SPECTROMETRY AND SECONDARY ION MASS-SPECTROMETRY BY ANALYSIS OF TANTALUM PENTOXIDE LAYERS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (14) : 2136 - 2141

[12] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[13] EFFECT OF GRADIENT ENERGY ON DIFFUSION IN GOLD-SILVER ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (05) : 2191 - +

[14] LOW-TEMPERATURE INTERDIFFUSION IN AU-PD AND AU-RH THIN-FILM COUPLES [J]. THIN SOLID FILMS, 1975, 25 (02) : 441 - 448

[15] An X-ray method of determining rates of diffusion in the solid state [J]. JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) : 357 - 365

[16] Selective x-ray diffraction from artificially stratified metal films deposited by evaporation [J]. PHYSICAL REVIEW, 1935, 48 (08): : 703 - 703

[17] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[18] FEDER R, 1972, J APPL PHYS, V43, P3283

[19] GRAIN-BOUNDARY SELF-DIFFUSION IN AU BY AR SPUTTERING TECHNIQUE [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4455 - 4458

[20] HALL PM, IN PRESS