ELECTROREFLECTANCE AND PHOTOREFLECTANCE MEASUREMENTS OF GAAS/ALAS SHORT-PERIOD SUPERLATTICES

被引:9
作者
RODRIGUEZ, JM
ARMELLES, G
BRIONES, F
机构
关键词
D O I
10.1016/0038-1098(88)90118-4
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:859 / 862
页数:4
相关论文
共 10 条
[1]   GAAS, ALAS, AND ALXGA1-XAS - MATERIAL PARAMETERS FOR USE IN RESEARCH AND DEVICE APPLICATIONS [J].
ADACHI, S .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) :R1-R29
[2]   HIGH-RESOLUTION INTERBAND-ENERGY MEASUREMENTS FROM ELECTROREFLECTANCE SPECTRA [J].
ASPNES, DE ;
ROWE, JE .
PHYSICAL REVIEW LETTERS, 1971, 27 (04) :188-&
[3]   GAAS LOWER CONDUCTION-BAND MINIMA - ORDERING AND PROPERTIES [J].
ASPNES, DE .
PHYSICAL REVIEW B, 1976, 14 (12) :5331-5343
[4]  
ASPNES DE, 1986, J APPL PHYS, V60, P759
[5]   SUPER-LATTICE BAND-STRUCTURE IN THE ENVELOPE-FUNCTION APPROXIMATION [J].
BASTARD, G .
PHYSICAL REVIEW B, 1981, 24 (10) :5693-5697
[6]   ELECTRONIC STATES AND THICKNESSES OF GAAS/GAALAS QUANTUM WELLS AS MEASURED BY ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY [J].
ERMAN, M ;
THEETEN, JB ;
FRIJLINK, P ;
GAILLARD, S ;
HIA, FJ ;
ALIBERT, C .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (11) :3241-3249
[7]   INTERBAND-TRANSITIONS OF THIN-LAYER GAAS/ALAS SUPERLATTICES [J].
GARRIGA, M ;
CARDONA, M ;
CHRISTENSEN, NE ;
LAUTENSCHLAGER, P ;
ISU, T ;
PLOOG, K .
PHYSICAL REVIEW B, 1987, 36 (06) :3254-3258
[8]   REFLECTANCE OF ALAS-GAAS AND IN0.28GA0.72AS-GAAS SUPERLATTICES [J].
LAIDIG, WD ;
BLANKS, DK ;
SCHETZINA, JF .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (06) :1791-1796
[9]   OBSERVATION OF SUPER-LATTICE EFFECTS ON THE ELECTRONIC BANDS OF MULTILAYER HETEROSTRUCTURES [J].
MENDEZ, EE ;
CHANG, LL ;
LANDGREN, G ;
LUDEKE, R ;
ESAKI, L ;
POLLAK, FH .
PHYSICAL REVIEW LETTERS, 1981, 46 (18) :1230-1234
[10]   LIGHT-SCATTERING DETERMINATION OF BAND OFFSETS IN GAAS/(ALGA)AS AND GASB/(ALGA)SB QUANTUM-WELLS - A COMPARATIVE-STUDY [J].
MENENDEZ, J ;
PINCZUK, A ;
WERDER, DJ ;
GOSSARD, AC ;
ENGLISH, JH ;
CHIU, TH ;
TSANG, WT .
SUPERLATTICES AND MICROSTRUCTURES, 1987, 3 (02) :163-166